1.6.13 Contact with time-dependent prescribed interference values

Product: Abaqus/Standard  

Elements tested

CPE4    C3D8   

Features tested

Contact interference

Surface on a deformable body, surface on a deformable body or a rigid surface, and magnitude of allowable interference

Problem description

The tests exercise the three ways in which contact interference can be used. Either a simple amount of allowable interference is specified, an allowable interference along a prescribed direction is specified, or the automatic shrink fit procedure is invoked. In this latter case Abaqus initializes the amount of allowable interference at each contact point with the penetration it calculates at the beginning of the analysis.

Most of the models consist of two elements lying next to each other with their contact surfaces initially interfering by a magnitude of 0.2 units. In the case of rigid surfaces there is only one element initially interfering with a straight rigid surface. The solid elements are either 4-node quads or 8-node bricks, as a substrate for the appropriate contact elements. A contact interference of magnitude 0.2 units is used to resolve the interference in (typically) five increments.

In the case of tube within tube elements (ITT) the model consists of two beams at a variable transverse distance from each other. One is totally fixed, and the other is fixed only axially. An initial tube clearance of 0.5 units produces interferences of up to 0.5 units. This interference is resolved by using the contact interference definition with a magnitude of 0.5 units.

Material:

Solid

Young's modulus1.0 × 105
Poisson's ratio0.0
Conductivity5.0
Density0.5
Specific heat0.3

Interface

Friction coefficient0.0
Gap conductance2.0 (coupled temperature-displacement elements)

Results and discussion

The interference is resolved in five increments.

Input files

Surface-based contact

Allowable interference:


ei34siis.inp

C3D8 elements, small-sliding.

eig1siis.inp

C3D8 elements, small-sliding, node-based surface.

ei34siisf.inp

C3D8 elements, finite-sliding.

ei31siisf.inp

C3D8 elements, finite-sliding, node-based surface.

ei22siis.inp

CPE4 elements, small-sliding.

ei22ssis.inp

CPE4 elements, finite-sliding.

eip1sris.inp

CPE4 elements, analytical rigid surface.

Allowable interference along a prescribed direction:


ei34siid.inp

C3D8 elements, small-sliding.

ei34srid.inp

C3D8, R3D4 elements.

eig1siid.inp

C3D8 elements, small-sliding, node-based surface.

ei34siidf.inp

C3D8 elements, finite-sliding.

ei31siidf.inp

C3D8 elements, finite-sliding, node-based surface.

ei22siid.inp

CPE4 elements, small-sliding.

ei22ssid.inp

CPE4 elements, finite-sliding.

eip1srid.inp

CPE4 elements, analytical rigid surface.

Automatic shrink fit:


ei22siif.inp

CPE4 elements, small-sliding.

ei22ssif.inp

CPE4 elements, finite-sliding.

ei34siiff.inp

C3D8 elements, finite-sliding.

Contact element approach (undocumented)

Allowable interference:


ei21stvs.inp

B21, ITT21 elements.

eis1sgvs.inp

C3D8, GAPSPHER elements.

eiu1sgvs.inp

CPE4, GAPUNI elements.

Allowable interference along a prescribed direction:


ei21stvd.inp

B21, ITT21 elements.

eis1sgvd.inp

C3D8, GAPSPHER elements.

eiu1sgvd.inp

CPE4, GAPUNI elements.